Our singular product, PDb, is a combination parser, database, and automatic test-program generation framework. It is composed of a set of configurable reusable C++ classes and subsystems that have proven their utility by generating test programs for Advantest, Teradyne, and Verigy testers.
The parser reads IEEE Standard Test Interface Language (STIL) waveforms, timing, DC levels, test-flow, and ancillary specification, e.g. interface-hardware configurations, into a run-time database/framework optimized for integrated circuit test program translation and generation.
Database components are run-time accessible via an Application Programming Interface (API).
The framework is designed to generate native language test-programs for a variety of Automatic Test Equipment (ATE).
PDb tests and flows support standard and user-defined types via inheritance. Tester configurations (setups) are composed of per signal-group tester resources featuring programmable constraints. Tester resource parameters and constraints are specified as mathematical, boolean, and/or string expressions whose write formats are configured on a per-target-tester or as-required basis. Hardware configurations model chip to tester connectivity. Binning structures include soft and hard bin definitions and soft to hard bin maps.
PDb currently runs under Microsoft Windows 10. It does not translate test patterns. Pattern translators, readily available from other vendors, may be integrated by request.
The parser reads IEEE Standard Test Interface Language (STIL) waveforms, timing, DC levels, test-flow, and ancillary specification, e.g. interface-hardware configurations, into a run-time database/framework optimized for integrated circuit test program translation and generation.
Database components are run-time accessible via an Application Programming Interface (API).
The framework is designed to generate native language test-programs for a variety of Automatic Test Equipment (ATE).
PDb tests and flows support standard and user-defined types via inheritance. Tester configurations (setups) are composed of per signal-group tester resources featuring programmable constraints. Tester resource parameters and constraints are specified as mathematical, boolean, and/or string expressions whose write formats are configured on a per-target-tester or as-required basis. Hardware configurations model chip to tester connectivity. Binning structures include soft and hard bin definitions and soft to hard bin maps.
PDb currently runs under Microsoft Windows 10. It does not translate test patterns. Pattern translators, readily available from other vendors, may be integrated by request.